XPS, X-ray Photoelectron Spectrometer

The X-Ray Photoelectron Spectroscopy (XPS) system will be used for high- resolution chemical imaging, non-damaging depth profiling, sub-monolayer analysis, and band gap measurements on energy conversion devices and model systems. Further description is contained in Instructions To Tender

30-06-2016 12:00:00

73000000-2  Research and development services and related consultancy services
73100000-3  Research and experimental development services