Automatic Probe Station
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
14-12-2020 23:59:00
38900000-4 Miscellaneous evaluation or testing instruments
38000000-5 Laboratory, optical and precision equipments (excl. glasses)
38300000-8 Measuring instruments
38636000-2 Specialist optical instruments
Danmarks Tekniske Universitet - DTU
Anker Engelunds Vej 1
2800
Kgs. Lyngby
Denmark
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Christian Torrendrup
https://www.dtu.dk
| Notice | Date of dispatch |
|---|---|
| 02. Contract notice (TED (v209)) | 14-11-2020 23:10 |
| 03. Contract award notice (TED (v209)) | 08-02-2021 11:26 |
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
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