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Documents - Package 544998:1 - The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
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Other documents (Available after expression of interest)
 Appendix 1 - Requirement Specification FIB-SEM 14102026.docx
 Appendix 2 - prices.docx
 Appendix 3 - Solemn declaration regarding Russia.docx
 Appendix A - Consortium decleration.docx
 Appendix B - Letter of support.docx
 Draft agreement_DRAFT 14-10-2026.docx
 Tender Instructions - 14102026.pdf
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