Automatic Probe Station

DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.

14.12.2020 23.59.00

38900000-4  Erilaiset arviointi- ja testausvälineet
38000000-5  Laboratoriolaitteet, optiset ja tarkkuuslaitteet (lukuun ottamatta silmälaseja)
38300000-8  Mittalaitteet
38636000-2  Optiset erikoislaitteet