Automatic Probe Station
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
14.12.2020 23:59:00
38900000-4 Diverse evaluerings- eller testinstrumenter
38000000-5 Laboratorie-, optisk- og presisjonsutstyr (bortsett fra briller)
38300000-8 Måleinstrumenter
38636000-2 Optiske spesialinstrumenter
Danmarks Tekniske Universitet - DTU
Anker Engelunds Vej 1
2800
Kgs. Lyngby
Danmark
Se profil
Christian Torrendrup
https://www.dtu.dk
| Kunngjøring | Dato for oversendelse |
|---|---|
| 02. Kunngjøring av konkurranse (TED (v209)) | 14.11.2020 23:10 |
| 03. Kontraktstildeling (TED (v209)) | 08.02.2021 11:26 |
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
Vedhæftet som dokument