Automatic Probe Station
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
14.12.2020 23:59:00
38900000-4 Bewertungs- und Testinstrumente
38000000-5 Laborgeräte, optische Geräte und Präzisionsgeräte (außer Gläser)
38300000-8 Messinstrumente
38636000-2 Optische Fachinstrumente
Danmarks Tekniske Universitet - DTU
Anker Engelunds Vej 1
2800
Kgs. Lyngby
Dänemark
Profil anzeigen
Christian Torrendrup
https://www.dtu.dk
| Mitteilung | Datum des Versands |
|---|---|
| Auftragsbekanntmachung (TED (v209)) | 14.11.2020 23:10 |
| Bekanntmachung vergebener Aufträge (TED (v209)) | 08.02.2021 11:26 |
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
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