Automatic Probe Station

DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.

14/12/2020 23:59:00

38900000-4  Instrumentos diversos de avaliação ou ensaio
38000000-5  Equipamento laboratorial, óptico e de precisão (exc. óculos)
38300000-8  Instrumentos de medição
38636000-2  Instrumentos ópticos especializados