Automatic Probe Station
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
2020-12-14 23:59:00
38900000-4 Diverse mät- och provinstrument
38000000-5 Laboratorieutrustning, optisk utrustning och precisionsutrustning (exkl. glas)
38300000-8 Mätutrustning
38636000-2 Optiska specialinstrument
Danmarks Tekniske Universitet - DTU
Anker Engelunds Vej 1
2800
Kgs. Lyngby
Danmark
Se profil
Christian Torrendrup
https://www.dtu.dk
| Annons | Utsändningsdatum |
|---|---|
| 02. Meddelande om upphandling (TED (v209)) | 2020-11-14 23:10 |
| 03. Meddelande om tilldeling av kontrakt (TED (v209)) | 2021-02-08 11:26 |
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
Vedhæftet som dokument