Ultrafast Scanning Atomic Force Microscope

DTU Physics has a group investigating the interaction of materials with solutions and gases, in the presence and absence of organic compounds. The work aims to understand and control reactions such as dissolution of the materials and the nucleation of secondary phases on the solid surfaces. For this work, we need an atomic force microscope, that is flexible, to allow developments in hardware and software. We require ultrafast scanning, as well as the classical slow and fast scanning, because many of the reactions are rapid. Routine atomic scale resolution is essential, as well as micrometre scale mapping, with a number of approaches that are available using a rapidly oscillating cantilever, including chemical force mapping. Fluid and gas cells, control of temperature and humidity will allow in situ experiments. Reliability of operation and cooperative arrangements for instrument and software modification, repair and maintenance are important.

26.4.2022 10.00.00

38000000-5  Laboratoriolaitteet, optiset ja tarkkuuslaitteet (lukuun ottamatta silmälaseja)
38300000-8  Mittalaitteet
38340000-0  Määränmittausvälineet
38400000-9  Fysikaalisten ominaisuuksien mittausvälineet
38430000-8  Ilmaisimet ja analyysilaitteet
38432000-2  Analyysilaitteet
38500000-0  Testaus- ja koelaitteet
38510000-3  Mikroskoopit
38512000-7  Ioni- ja molekyylimikroskoopit
38512200-9  Monokulaarimikroskoopit
38514000-1  Pimeäkenttä- ja scanning probe -mikroskoopit
38514200-3  Scanning probe -mikroskoopit
38519000-6  Erilaiset yhdistelmät mikroskooppeihin
38519300-9  Mikroskooppien valo- tai videokuvauslisälaitteet
38540000-2  Testaus- ja mittauslaitteet