Automatic Probe Station
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
14-12-2020 23:59:00
38900000-4 Diverse apparatuur voor beoordeling en testen
38000000-5 Laboratoriuminstrumenten, optische en precisie-instrumenten (uitgezonderd brillen)
38300000-8 Instrumenten voor metingen
38636000-2 Speciale optische instrumenten
Danmarks Tekniske Universitet - DTU
Anker Engelunds Vej 1
2800
Kgs. Lyngby
Denemarken
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Christian Torrendrup
https://www.dtu.dk
| Type | Publicatiedatum |
|---|---|
| Aankondiging van een opdracht (TED (v209)) | 14-11-2020 23:10 |
| Aankondiging van een gegunde opdracht (TED (v209)) | 8-2-2021 11:26 |
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
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