Automatic Probe Station
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
14-12-2020 23:59:00
38900000-4 Diverse måle- og testapparatur
38000000-5 Laboratorieudstyr, optisk udstyr og præcisionsudstyr (ikke briller)
38300000-8 Måleudstyr
38636000-2 Optiske specialinstrumenter
Danmarks Tekniske Universitet - DTU
Anker Engelunds Vej 1
2800
Kgs. Lyngby
Danmark
Vis profil
Christian Torrendrup
https://www.dtu.dk
| Bekendtgørelse | Afsendelsesdato |
|---|---|
| 02. Udbudsbekendtgørelse (TED (v209)) | 14-11-2020 23:10 |
| 03. Bekendtgørelse om indgåede kontrakter (TED (v209)) | 08-02-2021 11:26 |
DTU is purchasing an automatic probe station for testing silicon integrated photonic circuits. The system is to be used for characterization of silicon-on-insulator chips and wafers. The probe station should be programmable to automatically align and test using electrical and optical probes on a sequence of several devices on the same sample.
Vedhæftet som dokument